Instability of the conducting film surface under mechanical and electrical loads 

R.V. Goldstein, T.M. Makhviladze, M.E. Sarychev


A model describing the influence of electromigration on the development of instability of free conducting film surface lying on a substrate is created. The conditions of instability initiation as a function of a value and direction of the electrical current as well as of a value and nature of the mechanical stresses taking place at the boundary with the substrate are obtained and analyzed.

Received: 04 April 2014   Revised: 27 April 2014   Accepted: 14 May 2014

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