Tungsten crystalline surface microrelief and nano hardness

S.S. Goncharov, K.V Gracheva, V.K Sundukov, Ye.I. Sedykin, I.V. Troitsky

Abstract

The Nano Scan scanning force microscope and the Solver PRO probe microscope have been used to evaluate the surface's properties. The electrochemical treatment influence upon the monocrystalline tungsten surface microrelief and nano hardness has been identified.

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