Tungsten crystalline surface microrelief and nano hardness

S.S. Goncharov, K.V. Gracheva, V.K. Sundukov, Y.I. Sedykin, I.V. Troitsky show affiliations and emails
Received 08 June 2011; Accepted 14 August 2011;
This paper is written in Russian
Citation: S.S. Goncharov, K.V. Gracheva, V.K. Sundukov, Y.I. Sedykin, I.V. Troitsky. Tungsten crystalline surface microrelief and nano hardness. Lett. Mater., 2011, 1(3) 147-150
BibTex   https://doi.org/10.22226/2410-3535-2011-3-147-150

Abstract

The Nano Scan scanning force microscope and the Solver PRO probe microscope have been used to evaluate the surface's properties. The electrochemical treatment influence upon the monocrystalline tungsten surface microrelief and nano hardness has been identified.

References (6)

1. K. Agte, I. Vacek. Tungsten and Molybdenum. Moscow, Energia Publishers (1964) 456p. (in Russian).
2. R.A. Andrievsky Advanced Materials 6, 5 (2001) (inRussian).
3. Ye.M. Savitsky, G.S. Burkhanov Physical Metallurgyof Refractory and Rare-Earth Metals. Moscow, NaukaPublishers (1980) 354 p. (in Russian).
4. S.Yu. Davydov Journal of Theoretical and ExperimentalPhysics. 72 (1), 96 (2002) (in Russian).
5. S.M. Alfimov, V.A. Bykov, Ye.P. Grebennikov et al. Nanoand Micro System Technologies. 8, 2 ( 2004) (in Russian).
6. V.L. Mironov Fundamentals of Scanning ProbeMicroscopy. Moscow, Technosphere Publishers (2004)144 p. (in Russian).

Similar papers